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[ACM Press the 9th ACM Multimedia Systems Conference - Amsterdam, Netherlands (2018.06.12-2018.06.15)] Proceedings of the 9th ACM Multimedia Systems Conference on - MMSys '18 - Blind image quality assessment based on multiscale salient local binary patterns
Freitas, Pedro Garcia, Alamgeer, Sana, Akamine, Welington Y. L., Farias, Mylène C. Q.Year:
2018
Language:
english
DOI:
10.1145/3204949.3204960
File:
PDF, 11.32 MB
english, 2018