Thickness Dependence of Optoelectrical Properties of Mo-Doped In 2 O 3 Films Deposited on Polyethersulfone Substrates by Ion-Beam-Assisted Evaporation
Kuo, Chin-Chiuan, Liu, Chi-Chang, Jeng, Yaug-Fea, Lin, Chung-Chih, Liou, Yeuh-Yeong, He, Ju-LiangVolume:
2010
Year:
2010
Language:
english
Journal:
Journal of Nanomaterials
DOI:
10.1155/2010/840316
File:
PDF, 2.83 MB
english, 2010