Thickness Dependence of Optoelectrical Properties of...

Thickness Dependence of Optoelectrical Properties of Mo-Doped In 2 O 3 Films Deposited on Polyethersulfone Substrates by Ion-Beam-Assisted Evaporation

Kuo, Chin-Chiuan, Liu, Chi-Chang, Jeng, Yaug-Fea, Lin, Chung-Chih, Liou, Yeuh-Yeong, He, Ju-Liang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
2010
Year:
2010
Language:
english
Journal:
Journal of Nanomaterials
DOI:
10.1155/2010/840316
File:
PDF, 2.83 MB
english, 2010
Conversion to is in progress
Conversion to is failed