Stoichiometry Calculation in Ba x Sr 1− x TiO 3 Solid Solution Thin Films, Prepared by RF Cosputtering, Using X-Ray Diffraction Peak Positions and Boltzmann Sigmoidal Modelling
Reséndiz-Muñoz, J., Fernández-Muñoz, J. L., Corona-Rivera, M. A., Zapata-Torres, M., Márquez-Herrera, A., Meléndez-Lira, M., Caballero-Briones, F., Chale-Lara, F., Zelaya-Ángel, O.Volume:
2017
Year:
2017
Language:
english
Journal:
Journal of Nanomaterials
DOI:
10.1155/2017/4308294
File:
PDF, 2.73 MB
english, 2017