Breakdown Phenomena in SD Cards Exposed to Proton...

Breakdown Phenomena in SD Cards Exposed to Proton Irradiation

KIMURA, Shinichi, KASUYA, Yoshihiro, TERAKURA, Masato
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Volume:
12
Year:
2014
Language:
english
Journal:
TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, AEROSPACE TECHNOLOGY JAPAN
DOI:
10.2322/tastj.12.31
File:
PDF, 3.62 MB
english, 2014
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