Defects in Advanced Electronic Materials and Novel Low...

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Defects in Advanced Electronic Materials and Novel Low Dimensional Structures || Defects for quantum information processing in silicon

Abe, Eisuke
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Year:
2018
Language:
english
DOI:
10.1016/B978-0-08-102053-1.00009-0
File:
PDF, 880 KB
english, 2018
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