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Stability of multiple Shockley type basal plane stacking faults in heavily nitrogen-doped 4H-SiC crystals
Mannen, Yuina, Shimada, Kana, Taniguchi, Chisato, Ohtani, NoboruLanguage:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2018.06.029
Date:
July, 2018
File:
PDF, 1.36 MB
english, 2018