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Development of slew-rate-limited time-over-threshold (ToT) ASIC for a multi-channel silicon-based ion detector
Uenomachi, M., Orita, T., Shimazoe, K., Takahashi, H., Ikeda, H., Tsujita, K., Sekiba, D.Volume:
13
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/13/01/C01040
Date:
January, 2018
File:
PDF, 2.37 MB
english, 2018