[IEEE 2007 70th ARFTG Microwave Measurement Conference (ARFTG) - Tempe, AZ (2007.11.29-2007.11.30)] 2007 70th ARFTG Microwave Measurement Conference (ARFTG) - An investigation on the modified cold-fet method for determining the gate resistance and inductance of the packaged GaN and SiC transistors

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