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[IEEE 2007 70th ARFTG Microwave Measurement Conference (ARFTG) - Tempe, AZ (2007.11.29-2007.11.30)] 2007 70th ARFTG Microwave Measurement Conference (ARFTG) - An investigation on the modified cold-fet method for determining the gate resistance and inductance of the packaged GaN and SiC transistors
Landa, Andres Zarate-de, Zuniga-Juarez, J.E., Reynoso-Hernandez, J.A., Maya-Sanchez, M.C., del Valle-Padilla, Juan Luis, Loo-Yau, J. R.Year:
2007
Language:
english
DOI:
10.1109/ARFTG.2007.8376232
File:
PDF, 263 KB
english, 2007