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Special issue: International conference on thermal, mechanical & multiphysics simulation and experiments in micro- and nano-electronics and systems [EuroSimE2017]
van Driel, Willem D., Wymyslowski, ArturLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.06.012
Date:
June, 2018
File:
PDF, 118 KB
english, 2018