Impact of nonuniform gate oxide shape on TFET performance:...

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Physica E: Low-dimensional Systems and Nanostructures 2018 / 7

Impact of nonuniform gate oxide shape on TFET performance: A reliability issue

Shaker, Ahmed, ElSabbagh, Mona, El-Banna, Mohamed M.
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Language:
english
Journal:
Physica E: Low-dimensional Systems and Nanostructures
DOI:
10.1016/j.physe.2018.07.001
Date:
July, 2018
File:
PDF, 860 KB
english, 2018
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