A study on back irradiation flat panel detector with crystal silicon based x-ray CMOS image sensor
Kim, Myung Soo, Kim, Yewon, Lim, Kyung Taek, Kang, Donguk, Cho, GyuseongLanguage:
english
Journal:
Radiation Physics and Chemistry
DOI:
10.1016/j.radphyschem.2018.06.014
Date:
June, 2018
File:
PDF, 2.95 MB
english, 2018