Characterization of thin irradiated epitaxial silicon...

Journal of Instrumentation 2015 / 02 Vol. 10; Iss. 2

Characterization of thin irradiated epitaxial silicon sensors for the CMS phase II pixel upgrade

Vignali, M. Centis
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Volume:
10
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/10/02/C02040
Date:
February, 2015
File:
PDF, 493 KB
english, 2015
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