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[IEEE 2018 2nd International Conference on Inventive Systems and Control (ICISC) - Coimbatore, India (2018.1.19-2018.1.20)] 2018 2nd International Conference on Inventive Systems and Control (ICISC) - A fault avoidance approach with test set generation in combinational circuits using genetic algorithm
Arya, Namita, Singh, Amit PrakashYear:
2018
Language:
english
DOI:
10.1109/ICISC.2018.8399045
File:
PDF, 378 KB
english, 2018