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The influence of microwave pulse repetition frequency on the thermal burnout effect of a PIN diode limiting-amplifying system
Yi, Shipeng, Du, ZhengweiVolume:
85
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.04.018
Date:
June, 2018
File:
PDF, 1016 KB
english, 2018