Gradient Reference Specimens for Advanced Scanned Probe...

Microscopy Today 2004 / 07 Vol. 12; Iss. 4

Gradient Reference Specimens for Advanced Scanned Probe Microscopy

Julthongpiput, Duangrut, Fasolka, Michael J., Amis, Eric J.
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Volume:
12
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500054845
Date:
July, 2004
File:
PDF, 7.84 MB
english, 2004
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