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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2018

Logic Bug Detection and Localization Using Symbolic Quick Error Detection

Singh, Eshan, Lin, David, Barrett, Clark, Mitra, Subhasish
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2018.2834401
File:
PDF, 2.45 MB
english, 2018
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