EM Information Security Threats Against RO-Based TRNGs: The Frequency Injection Attack Based on IEMI and EM Information Leakage
Osuka, Saki, Fujimoto, Daisuke, Hayashi, Yu-ichi, Homma, Naofumi, Beckers, Arthur, Balasch, Josep, Gierlichs, Benedikt, Verbauwhede, IngridYear:
2018
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2018.2844027
File:
PDF, 974 KB
english, 2018