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[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Parallel order ATPG for test compaction
Chen, Yu-Wei, Ho, Yu-Hao, Chang, Chih-Ming, Yang, Kai-Chieh, Li, Ming-Ting, Li, James Chien-MoYear:
2018
Language:
english
DOI:
10.1109/VLSI-DAT.2018.8373264
File:
PDF, 584 KB
english, 2018