A test rig for analysis of adhesive tapes at 4 K cryogenic...

IOP Conference Series Materials Science and Engineering 2017 / 02 Vol. 171

A test rig for analysis of adhesive tapes at 4 K cryogenic temperature

Funke, Thomas, Germer, Alexander, Haberstroh, Christoph, Mayrhofer, Robert, Stipsitz, Johannes
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Volume:
171
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/171/1/012134
Date:
February, 2017
File:
PDF, 979 KB
english, 2017
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