[IEEE 2018 IEEE European Test Symposium (ETS) - Bremen,...

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[IEEE 2018 IEEE European Test Symposium (ETS) - Bremen, Germany (2018.5.28-2018.6.1)] 2018 IEEE 23rd European Test Symposium (ETS) - Towards the formal verification of security properties of a Network-on-Chip router

Sepulveda, Johanna, Aboul-Hassan, Damian, Sigl, Georg, Becker, Bernd, Sauer, Matthias
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Year:
2018
Language:
english
DOI:
10.1109/ETS.2018.8400692
File:
PDF, 1.11 MB
english, 2018
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