Enhancing Materials and Device Analysis Capability in the...

Enhancing Materials and Device Analysis Capability in the SEM and FIB-SEM by using a Nanomanipulator

Hiscock, Matthew, Lang, Christian, Statham, Peter, Bauer, Frank, Hartfield, Cheryl
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Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616000933
Date:
July, 2016
File:
PDF, 416 KB
english, 2016
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