Bias Exponent of Resistance Noise as a Probe for Disordered...

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Bias Exponent of Resistance Noise as a Probe for Disordered Systems

Dey, Animesh Kr., Nandi, Upendranath, Talukdar, Deep, Chakrabarty, Rajkumar, Bardhan, Kamal Kumar
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Language:
english
Journal:
physica status solidi (b)
DOI:
10.1002/pssb.201700664
Date:
July, 2018
File:
PDF, 553 KB
english, 2018
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