[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Flash read disturb management using adaptive cell bit-density with in-place reprogramming
Wu, Tai-Chou, Ma, Yu-Ping, Chang, Li-PinYear:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342030
File:
PDF, 193 KB
english, 2018