[IEEE 2018 Design, Automation & Test in Europe...

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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Flash read disturb management using adaptive cell bit-density with in-place reprogramming

Wu, Tai-Chou, Ma, Yu-Ping, Chang, Li-Pin
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Year:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342030
File:
PDF, 193 KB
english, 2018
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