Thin film metrology and microwave loss characterization of...

Journal of Applied Physics 2018 / 05 Vol. 123; Iss. 20

Thin film metrology and microwave loss characterization of indium and aluminum/indium superconducting planar resonators

McRae, C. R. H., Béjanin, J. H., Earnest, C. T., McConkey, T. G., Rinehart, J. R., Deimert, C., Thomas, J. P., Wasilewski, Z. R., Mariantoni, M.
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Volume:
123
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5020514
Date:
May, 2018
File:
PDF, 1.51 MB
english, 2018
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