Investigation of radiation hardness improvement by applying...

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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2018 / 6

Investigation of radiation hardness improvement by applying back-gate bias for FD-SOI MOSFETs

Kurachi, Ikuo, Kobayashi, Kazuo, Okihara, Masao, Kasai, Hiroki, Hatsui, Takaki, Hara, Kazuhiko, Miyoshi, Toshinobu, Arai, Yasuo
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Language:
english
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:
10.1016/j.nima.2018.05.068
Date:
June, 2018
File:
PDF, 762 KB
english, 2018
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