Sub-Ångstrom Resolution with a Mid-Voltage TEM

Microscopy Today 2004 / 05 Vol. 12; Iss. 3

Sub-Ångstrom Resolution with a Mid-Voltage TEM

O'Keefe, Michael A., Hetherington, Crispin J.D., Chris Nelson, E.
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Volume:
12
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500052123
Date:
May, 2004
File:
PDF, 4.28 MB
english, 2004
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