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[IEEE 2018 International Conference on IC Design & Technology (ICICDT) - Otranto, Italy (2018.6.4-2018.6.6)] 2018 International Conference on IC Design & Technology (ICICDT) - Electrical characterization of process induced effects on non-silicon devices
Young, Chadwin D., Bolshakov, Pavel, Rodriguez-Davila, Rodolfo A., Zhao, Peng, Khosravi, Ava, Mejia, Israel, Quevedo-Lopez, Manuel, Hinkle, Christopher L., Wallace, Robert M.Year:
2018
Language:
english
DOI:
10.1109/ICICDT.2018.8399784
File:
PDF, 1.17 MB
english, 2018