Correlation between passivation film density and...

Japanese Journal of Applied Physics 2018 / 08 Vol. 57; Iss. 8

Correlation between passivation film density and reliability of In–Ga–Zn–O thin-film transistors

Aman, S. G. Mehadi, Furuta, Mamoru
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Volume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.088001
Date:
August, 2018
File:
PDF, 1.49 MB
english, 2018
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