[IEEE 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Budapest, Hungary (2018.4.25-2018.4.27)] 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Flip-Flop SEUs Mitigation through Partial Hardening of Internal Latch and Adjustment of Clock Duty Cycle

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