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[IEEE 2018 7th International Symposium on Next Generation Electronics (ISNE) - Taipei, Taiwan (2018.5.7-2018.5.9)] 2018 7th International Symposium on Next Generation Electronics (ISNE) - Reliability study of hybrid wide drain poly-Si FinTFT
Yang, Chan-Chia, Zeng, Yan-Wei, Hu, Hsin-HuiYear:
2018
Language:
english
DOI:
10.1109/ISNE.2018.8394661
File:
PDF, 403 KB
english, 2018