[IEEE 2018 7th International Symposium on Next Generation...

  • Main
  • [IEEE 2018 7th International Symposium...

[IEEE 2018 7th International Symposium on Next Generation Electronics (ISNE) - Taipei, Taiwan (2018.5.7-2018.5.9)] 2018 7th International Symposium on Next Generation Electronics (ISNE) - Reliability study of hybrid wide drain poly-Si FinTFT

Yang, Chan-Chia, Zeng, Yan-Wei, Hu, Hsin-Hui
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2018
Language:
english
DOI:
10.1109/ISNE.2018.8394661
File:
PDF, 403 KB
english, 2018
Conversion to is in progress
Conversion to is failed