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[IEEE 2018 7th International Symposium on Next Generation Electronics (ISNE) - Taipei, Taiwan (2018.5.7-2018.5.9)] 2018 7th International Symposium on Next Generation Electronics (ISNE) - 2×VDD-tolerant ESD detection circuit in a 90-nm low-voltage CMOS process
Yang, Zhaonian, Zhang, Yue, Yu, Ningmei, Liou, Juin J.Year:
2018
Language:
english
DOI:
10.1109/ISNE.2018.8394670
File:
PDF, 430 KB
english, 2018