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Bayesian Inference for the Piecewise Exponential Model for the Reliability of Multiple Repairable Systems
Arab, Ali, Rigdon, Steven E., Basu, Asit P.Volume:
44
Language:
english
Journal:
Journal of Quality Technology
DOI:
10.1080/00224065.2012.11917879
Date:
January, 2012
File:
PDF, 409 KB
english, 2012