Bended probe diagnostics of the plasma characteristics...

Plasma Science and Technology 2018 / 08 Vol. 20; Iss. 8

Bended probe diagnostics of the plasma characteristics within an ECR ion source with a rectangular waveguide

YANG, Juan, FU, Yuliang, LIU, Xianchuang, MENG, Haibo, JIN, Yizhou
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Volume:
20
Language:
english
Journal:
Plasma Science and Technology
DOI:
10.1088/2058-6272/aabb9f
Date:
August, 2018
File:
PDF, 1.77 MB
english, 2018
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