[IEEE 2018 IEEE International Vacuum Electronics Conference (IVEC) - Monterey, CA, USA (2018.4.24-2018.4.26)] 2018 IEEE International Vacuum Electronics Conference (IVEC) - Simulation and cold test of 220GHz staggered double vane slow wave structure
Tian, Hanwen, Shao, Wei, Wang, Zhanliang, Tang, Tao, Lu, Zhigang, Gong, Huarong, Duan, Zhaoyun, Wei, Yanyu, Gong, Yubin, Feng, JinjunYear:
2018
Language:
english
DOI:
10.1109/IVEC.2018.8391514
File:
PDF, 462 KB
english, 2018