Drain-induced barrier lowering in oxide semiconductor thin-film transistors with asymmetrical local density of states
Lee, Hyeon-Jun, Abe, Katsumi, Cho, Sung Haeng, Kim, June-Seo, Bang, Seokhwan, Lee, Myoung-JaeYear:
2018
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2018.2855731
File:
PDF, 790 KB
english, 2018