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[IEEE 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Granada (2018.3.19-2018.3.21)] 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Characterization of gate overlap capacitances and effective channel size in MOSFETs
Tomaszewski, Daniel, Gluszko, Grzegorz, Malesmska, JolantaYear:
2018
Language:
english
DOI:
10.1109/ULIS.2018.8354765
File:
PDF, 1.10 MB
english, 2018