Data Retention Characterization of Gate-Injected...

Nanomaterials 2017 / 11 Vol. 7; Iss. 11

Data Retention Characterization of Gate-Injected Gold-Nanoparticle Non-Volatile Memory with Low-Damage CF4-Plasma-Treated Blocking Oxide Layer

Liu, Yu-Hua, Kao, Chyuan-Haur, Cheng, Tsung-Chin, Wu, Chih-I, Wang, Jer-Chyi
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Volume:
7
Language:
english
Journal:
Nanomaterials
DOI:
10.3390/nano7110385
Date:
November, 2017
File:
PDF, 2.89 MB
english, 2017
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