Multiplicity factor and diffraction geometry factor for...

Science China Mathematics 2001 / 04 Vol. 44; Iss. 4

Multiplicity factor and diffraction geometry factor for single crystal X-ray diffraction analysis and measurement of phase content in cubic GaN/GaAs(001) epilayers

Bo Qu, Xinhe Zheng, Yutian Wang, Zhihong Feng, Jingyi Han, Shi’an Liu, Shiming Lin, Hui Yang, Junwu Liang
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Volume:
44
Language:
english
Pages:
7
DOI:
10.1007/bf02881887
Date:
April, 2001
File:
PDF, 407 KB
english, 2001
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