Structural study of sputtered nanocrystalline Ti and Zr by X-ray diffraction
Wangzhou Shi, Ruohe Yao, Kuixun Lin, Xuanying LinVolume:
42
Language:
english
Pages:
4
DOI:
10.1007/bf02882781
Date:
November, 1997
File:
PDF, 226 KB
english, 1997