Basic study of fine particle removal using microplasma and...

Japanese Journal of Applied Physics 2017 / 01 Vol. 56; Iss. 1S

Basic study of fine particle removal using microplasma and its electrostatic effect

Shimizu, Kazuo, Ito, Akihiko, Blajan, Marius, Kristof, Jaroslav, Yoneda, Hitoki
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Volume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.01AC03
Date:
January, 2017
File:
PDF, 1.54 MB
english, 2017
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