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Investigation of C60 and C70 fullerenes under low energy ion impact
Singhal, Rahul, Bhardwaj, Jyotsna, Vishnoi, Ritu, Sharma, Amit, Sharma, Ganesh D., Kanjilal, D.Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-018-9612-0
Date:
July, 2018
File:
PDF, 5.31 MB
english, 2018