Locating Si atoms in Si-doped boron carbide: A route to understand amorphization mitigation mechanism
Khan, Atta U., Etzold, Anthony M., Yang, Xiaokun, Domnich, Vladislav, Xie, Kelvin Y., Hwang, Chawon, Behler, Kristopher D., Chen, Mingwei, An, Qi, LaSalvia, Jerry C., Hemker, Kevin J., Goddard, WilliaVolume:
157
Language:
english
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2018.07.021
Date:
September, 2018
File:
PDF, 1.29 MB
english, 2018