Accuracy optimization of combined multiparameter measuring systems with application to polarized light microscopy
Kuian, Mykhailo, Reichel, Lothar, Shiyanovskii, Sergij V.Volume:
97
Language:
english
Journal:
Physical Review E
DOI:
10.1103/PhysRevE.97.063305
Date:
June, 2018
File:
PDF, 1.49 MB
english, 2018