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Ultra-High Vacuum Aberration-Corrected STEM for in-situ studies
Hotz, M.T., Corbin, G.J., Dellby, N., Krivanek, O.L., Mangier, C., Meyer, J.C.Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616001021
Date:
July, 2016
File:
PDF, 360 KB
english, 2016