![](/img/cover-not-exists.png)
[IEEE 2018 22nd International Microwave and Radar Conference (MIKON) - Poznan, Poland (2018.5.14-2018.5.17)] 2018 22nd International Microwave and Radar Conference (MIKON) - Study of residual VNA measurement errors due to imperfect Thru-Reflect-Match calibration standards
Szatkowski, Jaroslaw, Wiatr, WojciechYear:
2018
Language:
english
DOI:
10.23919/MIKON.2018.8405320
File:
PDF, 418 KB
english, 2018