[IEEE 2018 22nd International Microwave and Radar Conference (MIKON) - Poznan, Poland (2018.5.14-2018.5.17)] 2018 22nd International Microwave and Radar Conference (MIKON) - A review of the six-port technique for metrology applications
Lallemand, Simon, Haddadi, Kamel, Loyez, ChristopheYear:
2018
Language:
english
DOI:
10.23919/MIKON.2018.8405340
File:
PDF, 153 KB
english, 2018