Review on system development in eddy current testing and...

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IET Circuits Devices & Systems 2017 / 01

Review on system development in eddy current testing and technique for defect classification and characterization

Ali, Kharudin Bin, Abdalla, Ahmed N., Rifai, Damhuji, Faraj, Moneer A.
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Language:
english
Journal:
IET Circuits, Devices & Systems
DOI:
10.1049/iet-cds.2016.0327
Date:
January, 2017
File:
PDF, 7.77 MB
english, 2017
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