Scrubbing-aware Secure Deletion for 3D NAND Flash

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2018

Scrubbing-aware Secure Deletion for 3D NAND Flash

Wang, Wei-Chen, Ho, Chien-Chung, Chang, Yuan-Hao, Kuo, Tei-Wei, Lin, Ping-Hsien
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2018.2857260
File:
PDF, 2.23 MB
english, 2018
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