Collector Transport in SiGe HBTs Operating at Cryogenic Temperatures
Ying, Hanbin, Dark, Jason, Omprakash, Anup P., Wier, Brian R., Ge, Luwei, Raghunathan, Uppili, Lourenco, Nelson E., Fleetwood, Zachary E., Mourigal, Martin, Davidovic, Dragomir, Cressler, John D.Year:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2854288
File:
PDF, 2.49 MB
english, 2018