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Zero-Shot Learning - A Comprehensive Evaluation of the Good, the Bad and the Ugly
Xian, Yongqin, Lampert, Christoph H., Schiele, Bernt, Akata, ZeynepYear:
2018
Language:
english
Journal:
IEEE Transactions on Pattern Analysis and Machine Intelligence
DOI:
10.1109/TPAMI.2018.2857768
File:
PDF, 6.54 MB
english, 2018